Computer vision (CV) and image processing are two closely related fields that utilize techniques from artificial intelligence (AI) and pattern recognition to derive meaningful information from images, ...

A new technical paper titled “Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review” was published by researchers at KU Leuven and imec. “In this ...

Researchers at the Georgia Tech Research Institute recently combined machine learning, field-programmable gate arrays (FPGAs), graphics processing units (GPUs), and a novel radio frequency image ...